JPS636794U - - Google Patents
Info
- Publication number
- JPS636794U JPS636794U JP10067886U JP10067886U JPS636794U JP S636794 U JPS636794 U JP S636794U JP 10067886 U JP10067886 U JP 10067886U JP 10067886 U JP10067886 U JP 10067886U JP S636794 U JPS636794 U JP S636794U
- Authority
- JP
- Japan
- Prior art keywords
- metal chassis
- circuit board
- printed circuit
- connection structure
- cutout
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000002184 metal Substances 0.000 claims description 12
- 238000005476 soldering Methods 0.000 claims 1
- 229910000679 solder Inorganic materials 0.000 description 1
Landscapes
- Shielding Devices Or Components To Electric Or Magnetic Fields (AREA)
- Structure Of Receivers (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10067886U JPS636794U (en]) | 1986-06-30 | 1986-06-30 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10067886U JPS636794U (en]) | 1986-06-30 | 1986-06-30 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS636794U true JPS636794U (en]) | 1988-01-18 |
Family
ID=30970725
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP10067886U Pending JPS636794U (en]) | 1986-06-30 | 1986-06-30 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS636794U (en]) |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5551366A (en) * | 1978-10-12 | 1980-04-15 | Nec Corp | Measuring device for transistor power gain characteristic |
-
1986
- 1986-06-30 JP JP10067886U patent/JPS636794U/ja active Pending
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5551366A (en) * | 1978-10-12 | 1980-04-15 | Nec Corp | Measuring device for transistor power gain characteristic |